Failure Analysis Equipment Market – Global Industry Analysis and Forecast 2021-2027

Failure Analysis Equipment Market was valued US$ 3.9 Bn in 2020 and is expected to reach US$ 6.81 Bn by 2027, at a CAGR of around 8.3 % during a forecast period.Global Failure Analysis Equipment Market To know about the Research Methodology:-Request Free Sample Report The report includes the analysis of impact of COVID-19 lock-down on the revenue of market leaders, followers, and disrupters. Since lock down was implemented differently in different regions and countries, impact of same is also different by regions and segments. The report has covered the current short term and long term impact on the market, same will help decision makers to prepare the outline for short term and long term strategies for companies by region.

Failure Analysis Equipment Market Dynamics:

Increasing demand for failure analysis equipment from wireless communication and electronics manufacturing industries are the major factors driving the failure analysis market. The ever decreasing size and complicated circuit design requirement of semiconductor and embedded system has led to extensive acceptance of failure analysis equipment throughout the development process of integrated circuits (ICs). Furthermore, the demand from other manufacturing industries such as oil and gases and mining are boosting the market. The speculation concerning the efficiency of failure analysis equipment is acting as one of the major hindrances for the industry. Also, the high price of failure analysis equipment is limiting the wide adoption, particularly by the cost sensitive small and medium scale industries in Asia-Pacific region.

Failure Analysis Equipment Market Segment Analysis:

The Secondary Ion Mass Spectroscopy (SIMS) technology accounted for biggest market share in 2019 as it has an ability to identify all the elements in low concentration levels.

Failure Analysis Equipment Market Regional Analysis:

Globally, in 2019, Asia Pacific was the leading revenue generator for failure analysis equipment market. The dominance of Asia Pacific region is due to countries like China, India, Japan, Taiwan and Australia among others investing heavily in R&D infrastructure, nanotechnology as well as medical technology. Also, North America and Europe collectively accounted for over one-third of the market share, as these have been constantly focusing on R&D and have been using failure analysis equipment for R&D purpose. The global failure analysis test equipment market report provides fine intelligence that prepares market players to compete well against their roughest competitors on the basis of growth, sales, and other dynamic factors. The research study lays emphasis on key growth opportunities and market trends apart from critical market dynamics with market drivers and challenges. With the help of this report, interested parties can equip themselves to adapt according to the changes in failure analysis test equipment industry and secure a strong market position for years to come. This report delivers market development statistics, list of select leading players, deep regional analysis, and broad market segmentation study to give a complete understanding of global failure analysis test equipment market. The objective of the report is to present a comprehensive assessment of the market and it contains thoughtful insights, facts, historical data, industry-validated market data and projections with a suitable set of assumptions and methodology. The report also helps in understanding global failure analysis equipment market dynamics and structure by identifying and analyzing the market segments and project the global market size. Further, this report also focuses on the competitive analysis of key players by product, price, financial position, product portfolio, growth strategies, and regional presence. The report also provides PEST analysis, PORTER’s analysis, SWOT analysis to address the question of shareholders in prioritizing the efforts and investment in the near future to the emerging segment in global failure analysis equipment market.

Scope of Global Failure Analysis Equipment Market: Inquire before buying

Global Failure Analysis Equipment Market
Report Coverage Details
Base Year: 2020 Forecast Period: 2021-2027
Historical Data: 2016 to 2020 Market Size in 2020: US $ 3.9 Bn.
Forecast Period 2021 to 2027 CAGR: 8.3 % Market Size in 2027: US $ 6.81 Bn.
Segments Covered: by Equipment • Scanning electron microscope (SEM) • Transmission electron microscope (TEM) • Focused Ion Beam system (FIB) • Dual Beam (FIB/SEM) systems
by Technology • Secondary ION Mass Spectroscopy (SIMS) • Energy Dispersive X-Ray Spectroscopy (EDX) • Chemical Mechanical Planarization (CMP) • Focused ION Beam (FIB) • Broad ION Milling (BIM) • Reactive ION Etching (RIE)
by Application • Defect localization • Defect characterization • Others

Failure Analysis Equipment Market, by Region

• North America • Europe • Asia Pacific • Middle East & Africa • South America

GGlobal Failure Analysis Equipment Market, Key Players

• CARL Zeiss SMT GmbH • FEI Company • Hitachi High-Technologies Corporation • Jeol Ltd. • Tescan Orsay Holding, A.S. • Thermo Fisher Scientific Inc. • Intertek Group PLC • A&D Company Ltd. • Motion X Corporation • EAG (Evans Analytical Group) Inc. • Bruker • Semilab • HORIBA, Ltd. • Leica Microsystems GmbH • Veeco Instruments • Oxford Instruments • Eurofins Scientific • TESTiLABS • Exponent Inc. • Asahi Kasei Microdevices Corporation • Axcelis Technologies Inc.  

Global Failure Analysis Equipment Market

1. Preface 1.1. Report Scope and Market Segmentation 1.2. Research Highlights 1.3. Research Objectives 2. Assumptions and Research Methodology 2.1. Report Assumptions 2.2. Abbreviations 2.3. Research Methodology 2.3.1. Secondary Research 2.3.1.1. Secondary data 2.3.1.2. Secondary Sources 2.3.2. Primary Research 2.3.2.1. Data from Primary Sources 2.3.2.2. Breakdown of Primary Sources 3. Executive Summary: Global Failure Analysis Equipment Market Size, by Market Value (US$ Bn) 4. Market Overview 4.1. Introduction 4.2. Market Indicator 4.2.1. Drivers 4.2.2. Restraints 4.2.3. Opportunities 4.2.4. Challenges 4.3. Porter’s Analysis 4.4. Value Chain Analysis 4.5. Market Risk Analysis 4.6. SWOT Analysis 4.7. Industry Trends and Emerging Technologies 5. Supply Side and Demand Side Indicators 6. Global Failure Analysis Equipment Market Analysis and Forecast 6.1. Global Failure Analysis Equipment Market Size & Y-o-Y Growth Analysis 6.1.1. North America 6.1.2. Europe 6.1.3. Asia Pacific 6.1.4. Middle East & Africa 6.1.5. South America 7. Global Failure Analysis Equipment Market Analysis and Forecast, by Technology 7.1. Introduction and Definition 7.2. Key Findings 7.3. Global Failure Analysis Equipment Market Value Share Analysis, by Sources 7.4. Global Failure Analysis Equipment Market Size (US$ Bn) Forecast, by Technology 7.5. Global Failure Analysis Equipment Market Analysis, by Technology 7.6. Global Failure Analysis Equipment Market Attractiveness Analysis, by Technology 8. Global Failure Analysis Equipment Market Analysis and Forecast, by Application 8.1. Introduction and Definition 8.2. Key Findings 8.3. Global Failure Analysis Equipment Market Value Share Analysis, by Application 8.4. Global Failure Analysis Equipment Market Size (US$ Bn) Forecast, by Application 8.5. Global Failure Analysis Equipment Market Analysis, by Application 8.6. Global Failure Analysis Equipment Market Attractiveness Analysis, by Application 9. Global Failure Analysis Equipment Market Analysis and Forecast, by Equipment 9.1. Introduction and Definition 9.2. Key Findings 9.3. Global Failure Analysis Equipment Market Value Share Analysis, by Equipment 9.4. Global Failure Analysis Equipment Market Size (US$ Bn) Forecast, by Equipment 9.5. Global Failure Analysis Equipment Market Analysis, by Equipment 9.6. Global Failure Analysis Equipment Market Attractiveness Analysis, by Equipment 10. Global Failure Analysis Equipment Market Analysis, by Region 10.1. Global Failure Analysis Equipment Market Value Share Analysis, by Region 10.2. Global Failure Analysis Equipment Market Size (US$ Bn) Forecast, by Region 10.3. Global Failure Analysis Equipment Market Attractiveness Analysis, by Region 11. North America Failure Analysis Equipment Market Analysis 11.1. Key Findings 11.2. North America Failure Analysis Equipment Market Overview 11.3. North America Failure Analysis Equipment Market Value Share Analysis, by Technology 11.4. North America Failure Analysis Equipment Market Forecast, by Technology 11.4.1. Secondary ION Mass Spectroscopy (SIMS) 11.4.2. Energy Dispersive X-Ray Spectroscopy (EDX) 11.4.3. Chemical Mechanical Planarization (CMP) 11.4.4. Focused ION Beam (FIB) 11.4.5. Broad ION Milling (BIM) 11.4.6. Reactive ION Etching (RIE) 11.5. North America Failure Analysis Equipment Market Value Share Analysis, by Application 11.6. North America Failure Analysis Equipment Market Forecast, by Application 11.6.1. Defect localization 11.6.2. Defect characterization 11.6.3. Others 11.7. North America Failure Analysis Equipment Market Value Share Analysis, by Equipment 11.8. North America Failure Analysis Equipment Market Forecast, by Equipment 11.8.1. Scanning electron microscope (SEM) 11.8.2. Transmission electron microscope (TEM) 11.8.3. Focused Ion Beam system (FIB) 11.8.4. Dual Beam (FIB/SEM) systems 11.9. North America Failure Analysis Equipment Market Value Share Analysis, by Country 11.10. North America Failure Analysis Equipment Market Forecast, by Country 11.10.1. U.S. 11.10.2. Canada 11.11. North America Failure Analysis Equipment Market Analysis, by Country 11.12. U.S. Failure Analysis Equipment Market Forecast, by Technology 11.12.1. Secondary ION Mass Spectroscopy (SIMS) 11.12.2. Energy Dispersive X-Ray Spectroscopy (EDX) 11.12.3. Chemical Mechanical Planarization (CMP) 11.12.4. Focused ION Beam (FIB) 11.12.5. Broad ION Milling (BIM) 11.12.6. Reactive ION Etching (RIE) 11.13. U.S. Failure Analysis Equipment Market Forecast, by Application 11.13.1. Defect localization 11.13.2. Defect characterization 11.13.3. Others 11.14. U.S. Failure Analysis Equipment Market Forecast, by Equipment 11.14.1. Scanning electron microscope (SEM) 11.14.2. Transmission electron microscope (TEM) 11.14.3. Focused Ion Beam system (FIB) 11.14.4. Dual Beam (FIB/SEM) systems 11.15. Canada Failure Analysis Equipment Market Forecast, by Technology 11.15.1. Secondary ION Mass Spectroscopy (SIMS) 11.15.2. Energy Dispersive X-Ray Spectroscopy (EDX) 11.15.3. Chemical Mechanical Planarization (CMP) 11.15.4. Focused ION Beam (FIB) 11.15.5. Broad ION Milling (BIM) 11.15.6. Reactive ION Etching (RIE) 11.16. Canada Failure Analysis Equipment Market Forecast, by Application 11.16.1. Defect localization 11.16.2. Defect characterization 11.16.3. Others 11.17. Canada Failure Analysis Equipment Market Forecast, by Equipment 11.17.1. Scanning electron microscope (SEM) 11.17.2. Transmission electron microscope (TEM) 11.17.3. Focused Ion Beam system (FIB) 11.17.4. Dual Beam (FIB/SEM) systems 11.18. North America Failure Analysis Equipment Market Attractiveness Analysis 11.18.1. By Technology 11.18.2. By Application 11.18.3. By Equipment 11.19. PEST Analysis 11.20. Key Trends 11.21. Key Developments 12. Europe Failure Analysis Equipment Market Analysis 12.1. Key Findings 12.2. Europe Failure Analysis Equipment Market Overview 12.3. Europe Failure Analysis Equipment Market Value Share Analysis, by Technology 12.4. Europe Failure Analysis Equipment Market Forecast, by Technology 12.4.1. Secondary ION Mass Spectroscopy (SIMS) 12.4.2. Energy Dispersive X-Ray Spectroscopy (EDX) 12.4.3. Chemical Mechanical Planarization (CMP) 12.4.4. Focused ION Beam (FIB) 12.4.5. Broad ION Milling (BIM) 12.4.6. Reactive ION Etching (RIE) 12.5. Europe Failure Analysis Equipment Market Value Share Analysis, by Application 12.6. Europe Failure Analysis Equipment Market Forecast, by Application 12.6.1. Defect localization 12.6.2. Defect characterization 12.6.3. Others 12.7. Europe Failure Analysis Equipment Market Value Share Analysis, by Equipment 12.8. Europe Failure Analysis Equipment Market Forecast, by Equipment 12.8.1. Scanning electron microscope (SEM) 12.8.2. Transmission electron microscope (TEM) 12.8.3. Focused Ion Beam system (FIB) 12.8.4. Dual Beam (FIB/SEM) systems 12.9. Europe Failure Analysis Equipment Market Value Share Analysis, by Country 12.10. Europe Failure Analysis Equipment Market Forecast, by Country 12.10.1. Germany 12.10.2. U.K. 12.10.3. France 12.10.4. Italy 12.10.5. Spain 12.10.6. Rest of Europe 12.11. Europe Failure Analysis Equipment Market Analysis, by Country 12.12. Germany Failure Analysis Equipment Market Forecast, by Technology 12.12.1. Secondary ION Mass Spectroscopy (SIMS) 12.12.2. Energy Dispersive X-Ray Spectroscopy (EDX) 12.12.3. Chemical Mechanical Planarization (CMP) 12.12.4. Focused ION Beam (FIB) 12.12.5. Broad ION Milling (BIM) 12.12.6. Reactive ION Etching (RIE) 12.13. Germany Failure Analysis Equipment Market Forecast, by Application 12.13.1. Defect localization 12.13.2. Defect characterization 12.13.3. Others 12.14. Germany Failure Analysis Equipment Market Forecast, by Equipment 12.14.1. Scanning electron microscope (SEM) 12.14.2. Transmission electron microscope (TEM) 12.14.3. Focused Ion Beam system (FIB) 12.14.4. Dual Beam (FIB/SEM) systems 12.15. U.K. Failure Analysis Equipment Market Forecast, by Technology 12.15.1. Secondary ION Mass Spectroscopy (SIMS) 12.15.2. Energy Dispersive X-Ray Spectroscopy (EDX) 12.15.3. Chemical Mechanical Planarization (CMP) 12.15.4. Focused ION Beam (FIB) 12.15.5. Broad ION Milling (BIM) 12.15.6. Reactive ION Etching (RIE) 12.16. U.K. Failure Analysis Equipment Market Forecast, by Application 12.16.1. Defect localization 12.16.2. Defect characterization 12.16.3. Others 12.17. U.K. Failure Analysis Equipment Market Forecast, by Equipment 12.17.1. Scanning electron microscope (SEM) 12.17.2. Transmission electron microscope (TEM) 12.17.3. Focused Ion Beam system (FIB) 12.17.4. Dual Beam (FIB/SEM) systems 12.18. France Failure Analysis Equipment Market Forecast, by Technology 12.18.1. Secondary ION Mass Spectroscopy (SIMS) 12.18.2. Energy Dispersive X-Ray Spectroscopy (EDX) 12.18.3. Chemical Mechanical Planarization (CMP) 12.18.4. Focused ION Beam (FIB) 12.18.5. Broad ION Milling (BIM) 12.18.6. Reactive ION Etching (RIE) 12.19. France Failure Analysis Equipment Market Forecast, by Application 12.19.1. Defect localization 12.19.2. Defect characterization 12.19.3. Others 12.20. France Failure Analysis Equipment Market Forecast, by Equipment 12.20.1. Scanning electron microscope (SEM) 12.20.2. Transmission electron microscope (TEM) 12.20.3. Focused Ion Beam system (FIB) 12.20.4. Dual Beam (FIB/SEM) systems 12.21. Italy Failure Analysis Equipment Market Forecast, by Technology 12.21.1. Secondary ION Mass Spectroscopy (SIMS) 12.21.2. Energy Dispersive X-Ray Spectroscopy (EDX) 12.21.3. Chemical Mechanical Planarization (CMP) 12.21.4. Focused ION Beam (FIB) 12.21.5. Broad ION Milling (BIM) 12.21.6. Reactive ION Etching (RIE) 12.22. Italy Failure Analysis Equipment Market Forecast, by Application 12.22.1. Defect localization 12.22.2. Defect characterization 12.22.3. Others 12.23. Italy Failure Analysis Equipment Market Forecast, by Equipment 12.23.1. Scanning electron microscope (SEM) 12.23.2. Transmission electron microscope (TEM) 12.23.3. Focused Ion Beam system (FIB) 12.23.4. Dual Beam (FIB/SEM) systems 12.24. Spain Failure Analysis Equipment Market Forecast, by Technology 12.24.1. Secondary ION Mass Spectroscopy (SIMS) 12.24.2. Energy Dispersive X-Ray Spectroscopy (EDX) 12.24.3. Chemical Mechanical Planarization (CMP) 12.24.4. Focused ION Beam (FIB) 12.24.5. Broad ION Milling (BIM) 12.24.6. Reactive ION Etching (RIE) 12.25. Spain Failure Analysis Equipment Market Forecast, by Application 12.25.1. Defect localization 12.25.2. Defect characterization 12.25.3. Others 12.26. Spain Failure Analysis Equipment Market Forecast, by Equipment 12.26.1. Scanning electron microscope (SEM) 12.26.2. Transmission electron microscope (TEM) 12.26.3. Focused Ion Beam system (FIB) 12.26.4. Dual Beam (FIB/SEM) systems 12.27. Rest of Europe Failure Analysis Equipment Market Forecast, by Technology 12.27.1. Secondary ION Mass Spectroscopy (SIMS) 12.27.2. Energy Dispersive X-Ray Spectroscopy (EDX) 12.27.3. Chemical Mechanical Planarization (CMP) 12.27.4. Focused ION Beam (FIB) 12.27.5. Broad ION Milling (BIM) 12.27.6. Reactive ION Etching (RIE) 12.28. Rest of Europe Failure Analysis Equipment Market Forecast, by Application 12.28.1. Defect localization 12.28.2. Defect characterization 12.28.3. Others 12.29. Rest Of Europe Failure Analysis Equipment Market Forecast, by Equipment 12.29.1. Scanning electron microscope (SEM) 12.29.2. Transmission electron microscope (TEM) 12.29.3. Focused Ion Beam system (FIB) 12.29.4. Dual Beam (FIB/SEM) systems 12.30. Europe Failure Analysis Equipment Market Attractiveness Analysis 12.30.1. By Technology 12.30.2. By Application 12.30.3. By Equipment 12.31. PEST Analysis 12.32. Key Trends 12.33. Key Developments 13. Asia Pacific Failure Analysis Equipment Market Analysis 13.1. Key Findings 13.2. Asia Pacific Failure Analysis Equipment Market Overview 13.3. Asia Pacific Failure Analysis Equipment Market Value Share Analysis, by Technology 13.4. Asia Pacific Failure Analysis Equipment Market Forecast, by Technology 13.4.1. Secondary ION Mass Spectroscopy (SIMS) 13.4.2. Energy Dispersive X-Ray Spectroscopy (EDX) 13.4.3. Chemical Mechanical Planarization (CMP) 13.4.4. Focused ION Beam (FIB) 13.4.5. Broad ION Milling (BIM) 13.4.6. Reactive ION Etching (RIE) 13.5. Asia Pacific Failure Analysis Equipment Market Value Share Analysis, by Application 13.6. Asia Pacific Failure Analysis Equipment Market Forecast, by Application 13.6.1. Defect localization 13.6.2. Defect characterization 13.6.3. Others 13.7. Asia Pacific Failure Analysis Equipment Market Value Share Analysis, by Equipment 13.8. Asia Pacific Failure Analysis Equipment Market Forecast, by Equipment 13.8.1. Scanning electron microscope (SEM) 13.8.2. Transmission electron microscope (TEM) 13.8.3. Focused Ion Beam system (FIB) 13.8.4. Dual Beam (FIB/SEM) systems 13.9. Asia Pacific Failure Analysis Equipment Market Value Share Analysis, by Country 13.10. Asia Pacific Failure Analysis Equipment Market Forecast, by Country 13.10.1. China 13.10.2. India 13.10.3. Japan 13.10.4. ASEAN 13.10.5. Rest of Asia Pacific 13.11. Asia Pacific Failure Analysis Equipment Market Analysis, by Country 13.12. China Failure Analysis Equipment Market Forecast, by Technology 13.12.1. Secondary ION Mass Spectroscopy (SIMS) 13.12.2. Energy Dispersive X-Ray Spectroscopy (EDX) 13.12.3. Chemical Mechanical Planarization (CMP) 13.12.4. Focused ION Beam (FIB) 13.12.5. Broad ION Milling (BIM) 13.12.6. Reactive ION Etching (RIE) 13.13. China Failure Analysis Equipment Market Forecast, by Application 13.13.1. Defect localization 13.13.2. Defect characterization 13.13.3. Others 13.14. China Failure Analysis Equipment Market Forecast, by Equipment 13.14.1. Scanning electron microscope (SEM) 13.14.2. Transmission electron microscope (TEM) 13.14.3. Focused Ion Beam system (FIB) 13.14.4. Dual Beam (FIB/SEM) systems 13.15. India Failure Analysis Equipment Market Forecast, by Technology 13.15.1. Secondary ION Mass Spectroscopy (SIMS) 13.15.2. Energy Dispersive X-Ray Spectroscopy (EDX) 13.15.3. Chemical Mechanical Planarization (CMP) 13.15.4. Focused ION Beam (FIB) 13.15.5. Broad ION Milling (BIM) 13.15.6. Reactive ION Etching (RIE) 13.16. India Failure Analysis Equipment Market Forecast, by Application 13.16.1. Defect localization 13.16.2. Defect characterization 13.16.3. Others 13.17. India Failure Analysis Equipment Market Forecast, by Equipment 13.17.1. Scanning electron microscope (SEM) 13.17.2. Transmission electron microscope (TEM) 13.17.3. Focused Ion Beam system (FIB) 13.17.4. Dual Beam (FIB/SEM) systems 13.18. Japan Failure Analysis Equipment Market Forecast, by Technology 13.18.1. Secondary ION Mass Spectroscopy (SIMS) 13.18.2. Energy Dispersive X-Ray Spectroscopy (EDX) 13.18.3. Chemical Mechanical Planarization (CMP) 13.18.4. Focused ION Beam (FIB) 13.18.5. Broad ION Milling (BIM) 13.18.6. Reactive ION Etching (RIE) 13.19. Japan Failure Analysis Equipment Market Forecast, by Application 13.19.1. Defect localization 13.19.2. Defect characterization 13.19.3. Others 13.20. Japan Failure Analysis Equipment Market Forecast, by Equipment 13.20.1. Scanning electron microscope (SEM) 13.20.2. Transmission electron microscope (TEM) 13.20.3. Focused Ion Beam system (FIB) 13.20.4. Dual Beam (FIB/SEM) systems 13.21. ASEAN Failure Analysis Equipment Market Forecast, by Technology 13.21.1. Secondary ION Mass Spectroscopy (SIMS) 13.21.2. Energy Dispersive X-Ray Spectroscopy (EDX) 13.21.3. Chemical Mechanical Planarization (CMP) 13.21.4. Focused ION Beam (FIB) 13.21.5. Broad ION Milling (BIM) 13.21.6. Reactive ION Etching (RIE) 13.22. ASEAN Failure Analysis Equipment Market Forecast, by Application 13.22.1. Defect localization 13.22.2. Defect characterization 13.22.3. Others 13.23. ASEAN Failure Analysis Equipment Market Forecast, by Equipment 13.23.1. Scanning electron microscope (SEM) 13.23.2. Transmission electron microscope (TEM) 13.23.3. Focused Ion Beam system (FIB) 13.23.4. Dual Beam (FIB/SEM) systems 13.24. Rest of Asia Pacific Failure Analysis Equipment Market Forecast, by Technology 13.24.1. Secondary ION Mass Spectroscopy (SIMS) 13.24.2. Energy Dispersive X-Ray Spectroscopy (EDX) 13.24.3. Chemical Mechanical Planarization (CMP) 13.24.4. Focused ION Beam (FIB) 13.24.5. Broad ION Milling (BIM) 13.24.6. Reactive ION Etching (RIE) 13.25. Rest of Asia Pacific Failure Analysis Equipment Market Forecast, by Application 13.25.1. Defect localization 13.25.2. Defect characterization 13.25.3. Others 13.26. Rest of Asia Pacific Failure Analysis Equipment Market Forecast, by Equipment 13.26.1. Scanning electron microscope (SEM) 13.26.2. Transmission electron microscope (TEM) 13.26.3. Focused Ion Beam system (FIB) 13.26.4. Dual Beam (FIB/SEM) systems 13.27. Asia Pacific Failure Analysis Equipment Market Attractiveness Analysis 13.27.1. By Technology 13.27.2. by Application 13.27.3. by Equipment 13.28. PEST Analysis 13.29. Key Trends 13.30. Key Developments 14. Middle East & Africa Failure Analysis Equipment Market Analysis 14.1. Key Findings 14.2. Middle East & Africa Failure Analysis Equipment Market Overview 14.3. Middle East & Africa Failure Analysis Equipment Market Value Share Analysis, by Technology 14.4. Middle East & Africa Failure Analysis Equipment Market Forecast, by Technology 14.4.1. Secondary ION Mass Spectroscopy (SIMS) 14.4.2. Energy Dispersive X-Ray Spectroscopy (EDX) 14.4.3. Chemical Mechanical Planarization (CMP) 14.4.4. Focused ION Beam (FIB) 14.4.5. Broad ION Milling (BIM) 14.4.6. Reactive ION Etching (RIE) 14.5. Middle East & Africa Failure Analysis Equipment Market Value Share Analysis, by Application 14.6. Middle East & Africa Failure Analysis Equipment Market Forecast, by Application 14.6.1. Defect localization 14.6.2. Defect characterization 14.6.3. Others 14.7. Middle East & Africa Failure Analysis Equipment Market Value Share Analysis, by Equipment 14.8. Middle East & Africa Failure Analysis Equipment Market Forecast, by Equipment 14.8.1. Scanning electron microscope (SEM) 14.8.2. Transmission electron microscope (TEM) 14.8.3. Focused Ion Beam system (FIB) 14.8.4. Dual Beam (FIB/SEM) systems 14.9. Middle East & Africa Failure Analysis Equipment Market Value Share Analysis, by Country 14.10. Middle East & Africa Failure Analysis Equipment Market Forecast, by Country 14.10.1. GCC 14.10.2. South Africa 14.10.3. Rest of Middle East & Africa 14.11. Middle East & Africa Failure Analysis Equipment Market Analysis, by Country 14.12. GCC Failure Analysis Equipment Market Forecast, by Technology 14.12.1. Secondary ION Mass Spectroscopy (SIMS) 14.12.2. Energy Dispersive X-Ray Spectroscopy (EDX) 14.12.3. Chemical Mechanical Planarization (CMP) 14.12.4. Focused ION Beam (FIB) 14.12.5. Broad ION Milling (BIM) 14.12.6. Reactive ION Etching (RIE) 14.13. GCC Failure Analysis Equipment Market Forecast, by Application 14.13.1. Defect localization 14.13.2. Defect characterization 14.13.3. Others 14.14. GCC Failure Analysis Equipment Market Forecast, by Equipment 14.14.1. Scanning electron microscope (SEM) 14.14.2. Transmission electron microscope (TEM) 14.14.3. Focused Ion Beam system (FIB) 14.14.4. Dual Beam (FIB/SEM) systems 14.15. South Africa Failure Analysis Equipment Market Forecast, by Technology 14.15.1. Secondary ION Mass Spectroscopy (SIMS) 14.15.2. Energy Dispersive X-Ray Spectroscopy (EDX) 14.15.3. Chemical Mechanical Planarization (CMP) 14.15.4. Focused ION Beam (FIB) 14.15.5. Broad ION Milling (BIM) 14.15.6. Reactive ION Etching (RIE) 14.16. South Africa Failure Analysis Equipment Market Forecast, by Application 14.16.1. Defect localization 14.16.2. Defect characterization 14.16.3. Others 14.17. South Africa Failure Analysis Equipment Market Forecast, by Equipment 14.17.1. Scanning electron microscope (SEM) 14.17.2. Transmission electron microscope (TEM) 14.17.3. Focused Ion Beam system (FIB) 14.17.4. Dual Beam (FIB/SEM) systems 14.18. Rest of Middle East & Africa Failure Analysis Equipment Market Forecast, by Technology 14.18.1. Secondary ION Mass Spectroscopy (SIMS) 14.18.2. Energy Dispersive X-Ray Spectroscopy (EDX) 14.18.3. Chemical Mechanical Planarization (CMP) 14.18.4. Focused ION Beam (FIB) 14.18.5. Broad ION Milling (BIM) 14.18.6. Reactive ION Etching (RIE) 14.19. Rest of Middle East & Africa Failure Analysis Equipment Market Forecast, by Application 14.19.1. Defect localization 14.19.2. Defect characterization 14.19.3. Others 14.20. Rest of Middle East & Africa Failure Analysis Equipment Market Forecast, by Equipment 14.20.1. Scanning electron microscope (SEM) 14.20.2. Transmission electron microscope (TEM) 14.20.3. Focused Ion Beam system (FIB) 14.20.4. Dual Beam (FIB/SEM) systems 14.21. Middle East & Africa Failure Analysis Equipment Market Attractiveness Analysis 14.21.1. By Technology 14.21.2. by Application 14.21.3. by Equipment 14.22. PEST Analysis 14.23. Key Trends 14.24. Key Developments 15. South America Failure Analysis Equipment Market Analysis 15.1. Key Findings 15.2. South America Failure Analysis Equipment Market Overview 15.3. South America Failure Analysis Equipment Market Value Share Analysis, by Technology 15.4. South America Failure Analysis Equipment Market Forecast, by Technology 15.4.1. Secondary ION Mass Spectroscopy (SIMS) 15.4.2. Energy Dispersive X-Ray Spectroscopy (EDX) 15.4.3. Chemical Mechanical Planarization (CMP) 15.4.4. Focused ION Beam (FIB) 15.4.5. Broad ION Milling (BIM) 15.4.6. Reactive ION Etching (RIE) 15.5. South America Failure Analysis Equipment Market Value Share Analysis, by Application 15.6. South America Failure Analysis Equipment Market Forecast, by Application 15.6.1. Defect localization 15.6.2. Defect characterization 15.6.3. Others 15.7. South America Failure Analysis Equipment Market Value Share Analysis, by Equipment 15.8. South America Failure Analysis Equipment Market Forecast, by Equipment 15.8.1. Scanning electron microscope (SEM) 15.8.2. Transmission electron microscope (TEM) 15.8.3. Focused Ion Beam system (FIB) 15.8.4. Dual Beam (FIB/SEM) systems 15.9. South America Failure Analysis Equipment Market Value Share Analysis, by Country 15.10. South America Failure Analysis Equipment Market Forecast, by Country 15.10.1. Brazil 15.10.2. Mexico 15.10.3. Rest of South America 15.11. South America Failure Analysis Equipment Market Analysis, by Country 15.12. Brazil Failure Analysis Equipment Market Forecast, by Technology 15.12.1. Secondary ION Mass Spectroscopy (SIMS) 15.12.2. Energy Dispersive X-Ray Spectroscopy (EDX) 15.12.3. Chemical Mechanical Planarization (CMP) 15.12.4. Focused ION Beam (FIB) 15.12.5. Broad ION Milling (BIM) 15.12.6. Reactive ION Etching (RIE) 15.13. Brazil Failure Analysis Equipment Market Forecast, by Application 15.13.1. Defect localization 15.13.2. Defect characterization 15.13.3. Others 15.14. Brazil Failure Analysis Equipment Market Forecast, by Equipment 15.14.1. Scanning electron microscope (SEM) 15.14.2. Transmission electron microscope (TEM) 15.14.3. Focused Ion Beam system (FIB) 15.14.4. Dual Beam (FIB/SEM) systems 15.15. Mexico Failure Analysis Equipment Market Forecast, by Technology 15.15.1. Secondary ION Mass Spectroscopy (SIMS) 15.15.2. Energy Dispersive X-Ray Spectroscopy (EDX) 15.15.3. Chemical Mechanical Planarization (CMP) 15.15.4. Focused ION Beam (FIB) 15.15.5. Broad ION Milling (BIM) 15.15.6. Reactive ION Etching (RIE) 15.16. Mexico Failure Analysis Equipment Market Forecast, by Application 15.16.1. Defect localization 15.16.2. Defect characterization 15.16.3. Others 15.17. Mexico Failure Analysis Equipment Market Forecast, by Equipment 15.17.1. Scanning electron microscope (SEM) 15.17.2. Transmission electron microscope (TEM) 15.17.3. Focused Ion Beam system (FIB) 15.17.4. Dual Beam (FIB/SEM) systems 15.18. Rest of South America Failure Analysis Equipment Market Forecast, by Technology 15.18.1. Secondary ION Mass Spectroscopy (SIMS) 15.18.2. Energy Dispersive X-Ray Spectroscopy (EDX) 15.18.3. Chemical Mechanical Planarization (CMP) 15.18.4. Focused ION Beam (FIB) 15.18.5. Broad ION Milling (BIM) 15.18.6. Reactive ION Etching (RIE) 15.19. Rest of South America Failure Analysis Equipment Market Forecast, by Application 15.19.1. Defect localization 15.19.2. Defect characterization 15.19.3. Others 15.20. Rest of South America Failure Analysis Equipment Market Forecast, by Equipment 15.20.1. Scanning electron microscope (SEM) 15.20.2. Transmission electron microscope (TEM) 15.20.3. Focused Ion Beam system (FIB) 15.20.4. Dual Beam (FIB/SEM) systems 15.21. South America Failure Analysis Equipment Market Attractiveness Analysis 15.21.1. By Technology 15.21.2. by Application 15.21.3. by Equipment 15.22. PEST Analysis 15.23. Key Trends 15.24. Key Developments 16. Company Profiles 16.1. Market Share Analysis, by Company 16.2. Competition Matrix 16.2.1. Competitive Benchmarking of key players by price, application, market share, Applications and R&D investment 16.2.2. New Product Launches and application 16.2.3. Market Consolidation 16.2.3.1. M&A by Regions, Investment and Applications 16.2.3.2. M&A Key Players, Forward Integration and Backward Integration 16.3. Company Profiles: Key Players 16.3.1. CARL Zeiss SMT GmbH 16.3.1.1. Company Overview 16.3.1.2. Financial Overview 16.3.1.3. Product Portfolio 16.3.1.4. Business Strategy 16.3.1.5. Recent Developments 16.3.1.6. Manufacturing Footprint 16.3.2. FEI Company 16.3.3. Hitachi High-Technologies Corporation 16.3.4. Jeol Ltd. 16.3.5. Tescan Orsay Holding, A.S. 16.3.6. Thermo Fisher Scientific Inc. 16.3.7. Intertek Group PLC 16.3.8. A&D Company Ltd. 16.3.9. Motion X Corporation 16.3.10. EAG (Evans Analytical Group) Inc. 16.3.11. Bruker 16.3.12. Semilab 16.3.13. HORIBA, Ltd. 16.3.14. Leica Microsystems GmbH 16.3.15. Veeco Instruments 16.3.16. Oxford Instruments 16.3.17. Eurofins Scientific 16.3.18. TESTiLABS 16.3.19. Exponent Inc. 16.3.20. Asahi Kasei Microdevices Corporation 16.3.21. Axcelis Technologies Inc. 17. Primary Key Insights

About This Report

Report ID 33553
Category Electronics
Published Date Aug 2019
Updated Date JAN 2022
Contact Us